Publikationen

2011

Bauer,, Michael ; Davydovskaya, Polina ; Janko, Marek ; Kaliwoda, Melanie ; Petersen, Nikolai ; Gilder, Stuart ; Stark, Robert W. :
Raman spectroscopy of laser-induced oxidation of titanomagnetites.
In: J. Raman Spectrosc.
[Artikel], (2011)

Gorbushina, A. A. ; Kempe, A. ; Rodenacker, K. ; Jütting, U. ; Altermann, W. ; Stark, R. W. ; Heckl, W. M. ; Krumbein, W. E. :
Quantitative 3-dimensional Image Analysis of Mineral Surface Modifications - Chemical, Mechanical and Biological.
In: Geomicrobiology J., 28 (2) 172 - 184.
[Artikel], (2011)

Peter, D. ; Dalmer, M. ; Lechner, A. ; Gigler, A. M. ; Stark, R. W. ; Bensch, W. :
Maesurement of the mechanical stability of semiconductor line structures in drying liquids with application to pattern collapse.
In: J. Micromech. Microeng., 21 025001.
[Artikel], (2011)

Wei, T. D. ; Gong, J. ; Rössle, S. C. ; Jamitzky, F. ; Heckl, W. M. ; Stark, R. W. :
A leucine-rich repeat assemply approach for homology modeling of the human TLR5-10 and mouse TLR 11-13 ectodomains.
In: J. Mol. Model., 17 pp. 27-36.
[Artikel], (2011)

2010

Janko, M. ; Davydovskaya, P. ; Bauer, M. ; Zink, A. ; Stark, R. W. :
Anisotropic Raman scattering in collagen bundles.
In: OPTICS LETTERS, 35 (16) pp. 2765-2767.
[Artikel], (2010)

Stark, R. W ; Stark, M.
Sattler (Ed), K. (ed.) :
Quantitative dynamic atomic force microscopy.
In: Handbook of Nanophysics. CRC Press , Boca Raton , 33.1-33.16.
[Buchkapitel], (2010)

Stark, R. W.
Sattler (Ed), K. (ed.) :
Nanomanipulation and nanorobotics with the atomic force microscope.
In: Handbook of Nanophysics. CRC Press , Boca Raton , 43.1-43.14.
[Buchkapitel], (2010)

Baumann, M. ; Stark, R. W. :
Dual frequency atomic force microscopy on charged surfaces.
In: Ultramicroscopy, 110 pp. 578-581.
[Artikel], (2010)

Lübbe, M. ; Gigler, A. M. ; Stark, R. W. ; Moritz, W. :
Identification of iron oxide phases in thin films grown on Al2O3(0001)by Raman spectroscopy and X-ray diffraction.
In: Surf. Sci, vol. 6 pp 679-685.
[Artikel], (2010)

Wei, T. ; Gong, J. ; Jamitzky, F. ; Heckl, W. M. ; Stark, R. W. ; Rössle, S. C. :
Homology modeling of human Toll-like receptors TLR7, 8, and 9 ligand-binding domains.
In: Protein Sci., vol. 1 pp. 1684—1691.
[Artikel], (2010)

Gong, J. ; Wei, T. D. ; Stark, R. W. ; Jamitzky, F. ; Heckl, W. M. ; Anders, H. J. ; Lech, M. ; Rössle, S. C. :
Inhibition of the Toll-like receptors TLR4 and 7 signaling pathways by SIGIRR – a computational approach.
In: J. Struct. Biol., vol. 1 pp 323-330.
[Artikel], (2010)

Gong, J. ; Wei, T. D. ; Zhang, N. ; Jamitzky, F. ; Heckl, W. M. ; Rössle, S. C. ; Stark, R. W. :
TollML: a database of toll-like receptor structural motifs.
In: J. Mol. Model, 16 pp. 1283-1289.
[Artikel], (2010)

Jamitzky, F. ; Stark, R. W. :
Intermittency in amplitude modulated dynamic atomic force microscopy.
In: Ultramicroscopy, 110 pp. 578-581.
[Artikel], (2010)

Janko, M. ; Zink, A. ; Gigler, A. M. ; Heckl, W. M. ; Stark, R. W. :
Nanostructure and mechanics of mummified type I collagen from the 5300-year-old Tyrolean Iceman.
In: Proc. Roy. Soc. B, 277 pp. 2301-2309.
[Artikel], (2010)

Lech, M. ; Skuginna, V. ; Kulkarni, O. P. ; Gong, J. ; Wei, T. ; Stark, R. W. ; Garlanda, C. ; Mantovani, A. ; Anders, H. J. :
Lack of SIGIRR/TIR8 aggravates hydrocarbon oil-induced systemic lupus nephritis.
In: J. Pathol., Vol. 2 pp 596 - 607.
[Artikel], (2010)

Stark, R. W. :
Bistability, higher harmonics and chaos in AFM.
In: Materials Today, 13 pp. 24-32.
[Artikel], (2010)

Walther, F. ; Drobek, T. ; Gigler, A. M. ; Hennemeyer, M. ; Kaiser, M. ; Herberg, H. ; Shimitsu, T. ; Morfill, G. E. ; Stark, R. W. :
Surface hydrophilisation of SU-8 by plasma and wet chemical processes.
In: Surf. Interf. Anal, 42 pp. 1735-1744.
[Artikel], (2010)

2009

Stark, R. W. :
Dynamics of repulsive dual frequency atomic force microscopy.
In: Appl. Phys. Lett., 94 063109.
[Artikel], (2009)

Bauer, M. ; Bischoff, M. ; Hülsenbusch, T. ; Matern, A. ; Stark, R. W. ; Kaiser, N. :
Onset of the optical damage in CaF2 optics caused by DUV lasers.
In: Optics Letters, vol. 3 (Iss. 2) pp. 3815-3817, 2009.
[Artikel], (2009)

Bauer, M. ; Bischoff, M. ; Jukresch, S. ; Hülsenbusch, T. ; Matern, A. ; Görtler, A. ; Stark, R. W. ; Chuvilin, A. ; Kaiser, U. :
Exterior surface damage of calcium fluoride outcoupling mirrors for DUV lasers.
In: Optics Express, vol. 1 pp. 8253–8263.
[Artikel], (2009)

Bauer, M. ; Gigler, A. M. ; Huber, A. ; Hillenbrand, R. ; Stark, R. W. :
Temperature depending Raman line-shift of silicon carbide.
In: J. Raman Spetrosc, vol. 4 pp. 1867 - 1874.
[Artikel], (2009)

Gigler, A. M. ; Huber, A. J. ; Bauer, M. ; Ziegler, A. ; Hillenbrand, R. ; Stark, R. W. :
Nanoscale residual stress-field mapping around nanoindents in SiC by IR s-SNOM and confocal Raman microscopy.
In: Optics Express, vol. 1 pp. 22351–22357.
[Artikel], (2009)

Peter, D. ; Dalmer, M. ; Kruwinus, H. ; Lechner, A. ; Archer, L. ; Gaulhofer, E. ; Gigler, A. M. ; Stark, R. W. ; Bensch, W. :
Measurement of the mechanical stability of semiconductor line structures in relevant media.
In: Vol. 16 , iss. 4 .
[Konferenz- oder Workshop-Beitrag], (2009)

Pompl, R. ; Jamitzky, F. ; Shimizu, T. ; Steffes, B. ; Bunk, W. ; Schmidt, H. ; Georgi, M. ; Ramrath, K. ; Stolz, W. ; Stark, R. W. ; Urayama, T. ; Fujii, S. ; Morfill, G. :
Effect of low-temperature plasma on bacteria observed by repeated AFM-imaging.
In: New J. Phys., vol. 1 (art. 1)
[Artikel], (2009)

Stark, R. W. :
Topography-induced forces in amplitude modulated dynamic atomic-force microscopy.
In: J. Scann. Probe Microsc., vol. 4 pp. 1-6.
[Artikel], (2009)

Yurtsever, A. ; Gigler, A.M. ; Stark, R.W. :
Amplitude and frequency modulation torsional resonance mode atomic force microscopy of a mineral surface.
In: Ultramicroscopy, vol. 1 pp. 275-279.
[Artikel], (2009)

von Sicard, O. ; Gigler, A. M. ; Drobek, T. ; Stark, R. W. :
Torsional noise of a colloidal probe in contact with surface-grafted PEG layers.
In: Langmuir, vol. 2 pp 2924–2927.
[Artikel], (2009)

2008

Bauer, M. ; Gigler, A. M. ; Richter, C. ; Stark, R. W. :
Visualizing stress in silicon microcantilevers using scanning confocal Raman spectroscopy.
In: Microelectr. Eng., vol. 8 pp 1443-1446.
[Artikel], (2008)

Dietz, C. ; Zerson, M. ; Riesch, C. ; Gigler, A. M. ; Stark, R. W. ; Rehse, N. ; Magerle, R. :
Nanotomography with enhanced resolution using bimodal atomic force microscopy.
In: Appl. Phys. Lett., vol. 9 (art. 1)
[Artikel], (2008)

Hennemeyer, M. ; Burghardt, S. ; Stark, R. W. :
Cantilever micro-rheometer for the characterization of sugar solutions.
In: Sensors, vol. 8 (iss. 1) pp 10-22.
[Artikel], (2008)

Hennemeyer, M. ; Walther, F. ; Kerstan, S. ; Schürzinger, K. ; Gigler, A. M. ; Stark, R. W. :
Cell proliferation assays on plasma activated SU-8.
In: Microelectr. Eng, vol 85 pp 1298-1301.
[Artikel], (2008)

Walther, F. ; Heckl, W. M. ; Stark, R. W. :
Evaluation of Nanoscale Roughness Measurements on a Plasma Treated SU-8 Polymer Surface by Atomic Force Microscopy.
In: Appl. Surf. Sci, vol. 2 pp. 7290–7295.
[Artikel], (2008)

Wei, T. ; Gong, J. ; Jamitzky, F. ; Heckl, W. M. ; Stark, R. W. ; Rössle, S. C. :
LRRML: a conformational database and an XML description of leucine-rich repeats (LRRs).
In: BMC Struct. Biol., vol. 8 (art. 4)
[Artikel], (2008)

Weissmüller, G. ; Yurtsever, A. ; Costa, L. T. ; Pacheco, A. B. F. ; Bisch, P. M. ; Heckl, W. M. ; Stark, R. W. :
Torsional resonance mode atomic force microscopy of a protein-DNA complex.
In: Nano, vol. 3 (iss. 6) pp 443-448.
[Artikel], (2008)

Yurtsever, A. ; Gigler, A. M. ; Dietz, C. ; Stark, R. W. :
Frequency modulated torsional resonance mode atomic force microscopy on polymers.
In: Appl. Phys. Lett, vol. 9 (art. 1)
[Artikel], (2008)

Yurtsever, A. ; Gigler, A. M. ; Stark, R. W. :
Frequency modulation torsional resonance mode AFM on chlorite (001).
J. Phys. Conf. Ser.
[Konferenz- oder Workshop-Beitrag], (2008)

2007

Yurtsever, A. ; Gigler, A. M. ; Macias, E. ; Stark, R. W. :
Response of a laterally vibrating nano-tip to surface forces.
In: Appl. Phys. Lett, vol. 9 (art. 2)
[Artikel], (2007)

Shimizu, S. ; Shimizu, T. ; Annaratone, B. M. ; Jacob, W. ; Linsmeier, C. ; Lindig, S. ; Stark, R. W. ; Jamitzky, F. ; Thomas, H. ; Sato, N. ; Morfill, G. E. :
The approach to diamond growth on levitating seed particles.
In: Appl. Surf. Sci, vol. 2 (177-18)
[Artikel], (2007)

Stark, R. W. :
Atomic force microscopy: Getting a feeling for the nanoworld.
In: Nature Nanotechnology pp. 461 - 462.
[Artikel], (2007)

Stark, R. W. ; Naujoks, N. ; Stemmer, A. :
Multifrequency electrostatic force microscopy in the repulsive regime.
In: Nanotechnology, vol. 1 (Art. 0)
[Artikel], (2007)

Vázquez, R. ; Rubio-Sierra, F. J. ; Stark, R. W. :
Multimodal analysis of force spectroscopy based on a transfer function study of micro-cantilevers.
In: Nanotechnology, vol. 1 (art. 1)
[Artikel], (2007)

Walther, F. ; Davydovskaya, P. ; Zürcher, S. ; Kaiser, M. ; Herberg, H. ; Gigler, A. M. ; Stark, R. W. :
Stability of the hydrophilic behaviour of oxygen plasma activated SU-8.
In: J. Micromech. Microeng., vol 17 pp. 524-531.
[Artikel], (2007)

2006

Hennemeyer, M. ; Burghardt, S. ; Stark, R. W. :
Low Cost cantilever Rheometer.
In: Int. Workshop on Nanomechanical Sensors, May 7-10, Copenhagen, Denmark.
[Konferenz- oder Workshop-Beitrag], (2006)

Jamitzky, F. ; Stark, M. ; Bunk, W. ; Heckl, W. M. ; Stark, R. W. :
Chaos in dynamic atomic force microscopy.
In: Nanotechnology, vol. 1 pp. S213-S220.
[Artikel], (2006)

Jamitzky, F. ; Stark, R. W. :
Intermittency in dynamic atomic force microscopy.
Proc. Int. Symp. Nonlinear Theory and its Applications NOLTA Bologna, Italy
[Konferenz- oder Workshop-Beitrag], (2006)

Jeutter, N. M. ; Hennemeyer, M. ; Stark, R. ; Stierle, A. ; Moritz, W. :
Growth of epitaxial Pr2O3 layers on Si(1 1 1).
In: Mater. Sci. Semicond. Proc., vol. 9 pp. 1079 - 1083.
[Artikel], (2006)

Rubio-Sierra, F. J. ; Vazquez, R. ; Stark, R. W. :
Transfer Function Analysis of the Micro Cantilever used in Atomic Force Microscopy.
In: IEEE T. Nanotechnology, vol. 5 pp 692-700.
[Artikel], (2006)

Rubio-Sierra, F. J. ; Yurtsever, A. ; Hennemeyer, M. ; Heckl, W. M. ; Stark, R. W. :
Acoustical force nano-lithography of thin polymer films.
In: Physica status solidi (a),, vol. 2 pp. 1481-1486.
[Artikel], (2006)

Stark, R. W. ; Stark, M.
Bhushan, B. ; Fuchs, H. (eds.) :
Higher harmonics in dynamic atomic force microscopy.
In: Applied Scanning Probe Methods II. Springer, Heidelberg . ISBN 3-540-26242-3
[Buchkapitel], (2006)

Vazquez, R. ; Rubio-Sierra, F. J. ; Stark, R. W. :
Transfer Function Analysis of a Surface Coupled Atomic Force Microscope.
In: American Control Conference, Minneapolis, USA.
[Konferenz- oder Workshop-Beitrag], (2006)

Walther, F. ; Zürcher, S. ; Hennemeyer, M. ; Kaiser, M. ; Herberg, H. ; Stark, R. W. :
Hydrophobic recovery of SU-8 after O2-plasma treatment.
In: Int. Workshop on Nanomechanical Sensors .
[Konferenz- oder Workshop-Beitrag], (2006)

2005

Jamitzky, F. ; Bunk, W. ; Stark, R. W. :
The Influence of Q-Control on the Non-linear Dynamics of Amplitude Modulation Atomic Force Microscopy.
In: Int. Symp. Nonlinear Theory and its Applications NOLTA, Brugge, Belgium.
[Konferenz- oder Workshop-Beitrag], (2005)

Kempe, A. ; Wirth, R. ; Altermann, W. ; Stark, R. W. ; Schopf, J. W. ; Heckl, W. M. :
Focussed Ion Beam Preparation and in Situ Nanoscopic Study of Precambrian Acritarchs.
In: Precambrian Research, vol. 1 pp. 36-54.
[Artikel], (2005)

Rubio-Sierra, F. J. ; Heckl, W. M ; Stark, R. W. :
Nanomanipulation by Atomic Force Microscopy.
In: Adv. Eng. Materials, vol. 7 p. 193-196.
[Artikel], (2005)

Stark, M. ; Guckenberger, R. ; Stemmer, A. ; Stark, R. W. :
Estimating the transfer function of the cantilever in atomic force microscopy: a system identification approach.
In: J. Appl. Phys., vol. 9 (art. 1)
[Artikel], (2005)

Stark, R. W. :
Force feedback in dynamic atomic force microscopy.
In: ASME Int. Mech. Eng. Conf. Exhibition, IMECE, Orlando, FL, USA.
[Konferenz- oder Workshop-Beitrag], (2005)

Stark, R. W. :
Time Delay Q-Control of the Microcantilever in Dynamic Atomic Force Microscopy.
In: Proc. 5th IEEE Conf. Nanotechnology, Nagoya, Japan.
[Konferenz- oder Workshop-Beitrag], (2005)

Stark, R. W. ; Naujoks, N. ; Stemmer, A. :
Detection of Injected Charges by Kelvin Probe and Multi-mode Electrostatic Force Microscopy.
In: Proc. 5th IEEE Conf. Nanotechnology, Nagoya, Japan.
[Konferenz- oder Workshop-Beitrag], (2005)

Vazquez, R. ; Rubio-Sierra, F. J. ; Stark, R. W. :
Transfer function analysis of atomic force microscope cantilevers.

[Konferenz- oder Workshop-Beitrag], (2005)

2004

Jamitzky, F. ; Stark, M. ; Bunk, W. ; Heckl, W. M. ; Stark, R. W. :
Nonlinear dynamics of a microcantilever in close proximity to a surface.
In: Proc. 2004 4th IEEE Conf. Nanotechnology, 17.-19. Aug, Munich, Germany.
[Konferenz- oder Workshop-Beitrag], (2004)

Mayer, M. ; Fischer, R. ; Lindig, S. ; von Toussaint, U. ; Stark, R. W. ; Dose, V. :
Bayesian reconstruction of surface roughness and depth profiles.
In: Nucl. Instr. Meth. Phys. Res. B, 228 p. 349-359.
[Artikel], (2004)

Rubio-Sierra, F. J. ; Burghardt, S. ; Heckl, W. M. ; Stark, R. :
Atomic Force Microscope as a tool for nanomanipulation.
In: Actuator 2004, Proc. 9th Int. Conf. on New Actuators, Bremen, Germany.
[Konferenz- oder Workshop-Beitrag], (2004)

Rubio-Sierra, F. J. ; Burghardt, S. ; Kempe, A. ; Heckl, W. M. ; Stark, R. W. :
Atomic force microscope based nanomanipulator for mechanical and optical lithography.
In: Proc. 2004 4th IEEE Conf. Nanotechnology, 17.-19. Aug, Munich, Germany.
[Konferenz- oder Workshop-Beitrag], (2004)

Schitter, G. ; Stark, R. W. ; Stemmer, A. :
Fast contact-mode atomic force microscopy on biological specimen by model-based control.
In: Ultramicroscopy, vol. 1 pp. 253-257.
[Artikel], (2004)

Stark, M. ; Guckenberger, R. ; Stemmer, A. ; Stark, R. W. :
Estimation of the transfer function of a microcantilever used in atomic-force microscopy.
In: Proc. 2004 4th IEEE Conf. Nanotechnology, 17.-19. Aug, Munich, Germany.
[Konferenz- oder Workshop-Beitrag], (2004)

Stark, R. W. :
Optical lever detection in higher eigenmode dynamic atomic force microscopy.
In: Rev. Sci. Instrum., 75 (11 pp. 5053-5055.
[Artikel], (2004)

Stark, R. W. :
Spectroscopy of higher harmonics in dynamic atomic force microscopy.
In: Nanotechnology, 15 (3) pp. 347-351.
[Artikel], (2004)

Stark, R. W. ; Schitter, G. ; Stark, M. ; Guckenberger, R. ; Stemmer, A. :
State space model of freely vibrating and surface-coupled cantilever dynamics in atomic force microscopy.
In: Phys. Rev., B (vol. 6) 085412.
[Artikel], (2004)

Stark, R. W. ; Schitter, G. ; Stark, M. ; Guckenberger, R. ; Stemmer, A. :
Towards time-resolved dynamic atomic force microscopy: A state space model for the AFM.
In: Acoustical Imaging. In: Edited by W. Arnold and S. Hirsekorn, Kluwer Academic/Plenum Publishers, Dordrecht & New York , 27 .
[Konferenz- oder Workshop-Beitrag], (2004)

2003

Stark, R. W. ; Rubio-Sierra, F. J ; Thalhammer, S. ; Heckl, W. M. :
Combined nanomanipulation by atomic force microscopy and UV-laser ablation for chromosomal dissection.
In: Eur. Biophys. J, vol. 3 pp 33-39.
[Artikel], (2003)

Rubio-Sierra, F. J. ; Stark, R. W. ; Thalhammer, S. ; Heckl, W. M. :
Force feedback joystick as a low cost haptic interface for an atomic force microscopy nanomanipulator.
In: Appl. Phys. A, vol. 7 pp. 903-906.
[Artikel], (2003)

Stark, R. W. :
Stark Dynamic force spectroscopy: Looking at the total harmonic distortion, in: Recent Advances in Multidisciplinary Applied Physics.
In: Proc. 1st Int. Meeting on Applied Physics 2003 (aphys2003), Badajoz, Spain.
[Konferenz- oder Workshop-Beitrag], (2003)

Stark, R. W. ; Heckl, W. M. :
Higher harmonics imaging in tapping mode atomic force microscopy.
In: Rev. Sci. Instrum., 74 (12 pp. 5111-5114.
[Artikel], (2003)

Stark, R. W. ; Sakai Stalder, M. ; Stemmer, A. :
Microfluidic etching driven by capillary forces for rapid prototyping of gold structures.
In: Microelectr. Eng., vol. 6 pp. 229-236.
[Artikel], (2003)

Stark, R. W. ; Schitter, G. ; Stemmer, A. :
Tuning Tip-sample forces in dynamic atomic force microscopy.
In: Proc. 12th Int. Conf. on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques 2003 (STM'03), Eindhoven, Netherlands.
[Konferenz- oder Workshop-Beitrag], (2003)

Stark, R. W. ; Schitter, G. ; Stemmer, A. :
Tuning the interaction forces in tapping mode atomic-force microscopy.
In: Phys. Rev. B, vol. 6 (art. 0)
[Artikel], (2003)

Stark, R. W. ; Schitter, G. ; Stemmer, A. :
Velocity dependent friction laws in contact mode atomic force microscopy.
In: Ultramicroscopy, vol. 1 pp. 309-317.
[Artikel], (2003)

2002

Schitter, G. ; Stark, R. W. ; Stemmer, A. :
Fast feedback control of piezoelectric actuators.
In: 8th Int. Conf. on New Actuators 2002, Bremen, Germany. In: Proc. Actuator 2002 .
[Konferenz- oder Workshop-Beitrag], (2002)

Schitter, G. ; Stark, R. W. ; Stemmer, A. :
Sensors for closed-loop piezo control: strain gauges versus optical sensors.
In: Meas. Sci. Technol, 13 pp. N47-N48.
[Artikel], (2002)

Stark, M. ; Stark, R. W. ; Guckenberger, R. :
Inverting dynamic force microscopy: From signals to time-resolved interaction forces.
In: Proc. Natl. Acad. Sci. USA, 99 (13 pp 8473-8478.
[Artikel], (2002)

Stark, R. W. ; Rubio, J. ; Thalhammer, S. ; Heckl, W. M. :
Extraction and manipulation of biological specimen combining UV-laser-ablation and atomic-force microscopy.
In: 8th Int. Conf. on New Actuators, Bremen, Germany. In: Proc. Actuator 2002 .
[Konferenz- oder Workshop-Beitrag], (2002)

2001

Drobek, T. ; Stark, R. W. ; Heckl, W. M. :
Determination of shear stiffness based on thermal noise analysis in atomic-force microscopy: Passive overtone microscopy.
In: Phys. Rev. B, vol. 6 (art. 0)
[Artikel], (2001)

Jamitzky, F. ; Stark, R. W. ; Bunk, W. ; Thalhammer, S. ; Räth, C. ; Aschenbrenner, T. ; Morfill, G. E. ; Heckl, W. M. :
Scaling-index method as an image processing tool in scanning-probe microscopy.
In: Ultramicroscopy, 86 (1- pp. 241-246.
[Artikel], (2001)

Stark, R. W. ; Drobek, T. ; Heckl, W. M. :
Thermomechanical noise of a free v-shaped cantilever for atomic-force microscopy.
In: Ultramicroscopy, vol. 8 pp. 207-215.
[Artikel], (2001)

Stark, R. W. ; Schitter, G. ; Rubio, J. ; Thalhammer, S. ; Stemmer, A. ; Heckl, W. M. :
Nanohandling and manipulation of biological specimen by atomic-force microscopy.
In: Europ. Cells & Mat..
[Konferenz- oder Workshop-Beitrag], (2001)

Thalhammer, S. ; Köhler, U. ; Stark, R. W. ; Heckl, W. M. :
GTG banding pattern on human metaphase chromosomes revealed by atomic force microscopy.
In: J. Microscopy, vol. 2 pp. 464-467.
[Artikel], (2001)

2000

Gobbi, P. ; Thalhammer, S. ; Falconi, M. ; Stark, R. W. ; Heckl, W. M. ; Mazzotti, G. :
Correlative high resolution morphologic analysis of the three-dimensional organization of human chromosomes.
In: Scanning, vol. 2 pp. 273-281.
[Artikel], (2000)

Göttlich, H. ; Stark, R. W. ; Pedarnig, J. D. ; Heckl, W. M. :
Noncontact scanning force microscopy based on modified tuning fork sensor.
In: Rev. Sci. Instr., vol. 7 pp. 3104-3107.
[Artikel], (2000)

Stark, M. ; Stark, R. W. ; Heckl, W. M. ; Guckenberger, R. :
Spectroscopy of the anharmonic cantilever oscillations in tapping-mode atomic force microscopy.
In: Appl. Phys. Lett., vol. 7 pp. 3293-3295.
[Artikel], (2000)

Stark, R. W. ; Heckl, W. M. :
Fourier transformed force microscopy: tapping mode atomic force microscopy beyond the Hookian approximation.
In: Surf. Sci.,, vol. 4 pp. 219-228.
[Artikel], (2000)

1999

Drobek, T. ; Stark, R. W. ; Gräber, M. ; Heckl, W. M. :
Overtone atomic force microscopy studies of decagonal quasicrystal surfaces.
In: New J. Phys., vol. 1
[Artikel], (1999)

Kamischke, R. ; Kollmer, F. ; Fuchs, H. ; Stark, R. ; Heckl, W. ; Benninghoven, A. :
Chemical characterization of modified nanotips by TOF-SIMS and Laser-SNMS.
In: Proc. XII Conf. on Secondary Ion Mass Spectroscopy SIMS XII, Brussels.
[Konferenz- oder Workshop-Beitrag], (1999)

Stark, R. W. ; Drobek, T. ; Heckl, W. M. :
Tapping mode atomic force microscopy and phase-imaging in higher eigenmodes.
In: Appl. Phys. Lett.,, vol. 7 pp. 3296-3298.
[Artikel], (1999)

1998

Jamitzky, F. ; Stark, R. W. ; Morfill, G. ; Heckl, W. M. :
Decomposition of atomic force microscopy images using the scaling index method for the investigation of DNA.
In: Computer-Assisted Micr., vol. 7 pp. 161-169.
[Artikel], (1998)

Stark, R. W. ; Thalhammer, S. ; Wienberg, J. ; Heckl, W. M. :
The AFM as a tool for chromosomal dissection – the influence of physical parameters.
In: Appl. Phys. A, vol. 6 S579-S584.
[Artikel], (1998)

Westall, F. ; Gobbi, P. ; Mazzotti, G. ; Gerneke, D. ; Stark, R. W. ; Drobek, T. ; Heckl, W. M. ; Gibson, E. ; McKay, D. ; Allen, C. ; Steel, A. ; Thomas-Keprta, K. :
Combined SEM (secondary electrons, backscatter, cathodoluminescence) and atomic force microscope investigation of the carbonate globules in Martian meteorite ALH84001 preliminary results.
In: Proc. SPIE.
[Konferenz- oder Workshop-Beitrag], (1998)

1997

Schütze, K. ; Becker, I. ; Becker, K. F. ; Thalhammer, S. ; Stark, R. ; Heckl, W. M. ; Pösl, H. :
Cut out or poke in – the key to the world of single genes: laser micromanipulation as a valuable tool on the look out for the origin of disease.
In: Gen. Analysis: Biomol. Eng., vol. 1 pp. 1-8.
[Artikel], (1997)

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